Scientists studying internal details of biological cells, semiconductors and virtually any material they don't want to destroy in the process may soon be able to use a new technique developed by researchers at Oak Ridge National Laboratory. The method, outlined in Nature Nanotechnology Letters, allows them to see surface and sub-surface details with unprecedented resolution. At the heart of the technology is an atomic force microscope that uses a force-sensing cantilever with a sharp tip to measure the topography and a host of other properties. Their concept, called mode-synthesizing atomic force microscopy, relies on multi-harmonic forcing of the sample and probe. "It is like paleontologists trying to find the shape of buried dinosaur skeletons using sound waves," said lead author Laurene Tetard. "Similarly, if we take a sample and mechanically shake it, then the probe can tell what's below the surface." Co-authors are Ali Passian and Thomas Thundat. Funding for this research is provided by the Department of Energy's Office of Biological and Environmental Research within the Office of Science.
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