The Anasys NanoIR2 instrument is equipped with a 4-chip QCL laser and is capable of simultaneously providing AFM topographic imaging with nanometer-scale resolution infrared spectroscopy and IR imaging with sub-100nm spatial resolution, as well as IR-SNOM with sub-20nm resolution. The instrument consists of an atomic force microscope designed for seamless integration with scattering Scanning Near Field Optical Microscopy (s-SNOM) and Atomic Force Microscopy Infrared (AFM-IR) techniques. In addition to nanoscale IR spectroscopy, the instrument can measure contact resonance frequencies of an AFM cantilever using the Lorentz Contact Resonance technique (LCR) in order to map variations in the sample’s mechanical properties; and provide local thermal properties via the nanoTA technique, for quantitative measurements of thermal transition temperatures at nanoscale spatial resolution.
Specifications:
- Sample size 12x12 mm
- Scan range (80x80 um)
- Z height limit (<10 µm)
- Laser spectral range from 900 cm-1 to 1800 cm-1.
Applications:
IR absorption spectroscopy for surface chemical recognition
Polymer composition analysis at the nanoscale
Equipment:
Anasys NanoIR2 (Bruker)
Contacts
IR absorption spectroscopy
Biophysics