The JA Woollam M-2000U of spectroscopic ellipsometer is engineered to meet the diverse demands of thin film characterization. An advanced optical design, wide spectral range, and fast data acquisition combine in an extremely powerful and versatile tool for analysis of the thickness and refractive index of multi-layered structures.
The following aftermarket sample cells are available for use with this instrument:
- Liquid cell for the study of liquid/solid interfaces
- Heated liquid cell (HLC-100) for the study of liquid/solid interfaces (RT to 50 C°)
- Linkam temperature controlled cell (-70 C° to 600 C°).
Applications
- Polymer films
- Photovoltaics
- Optical Coatings
- Conductive Organics
- Semiconductors
Specifications
- 245 – 1000 nm spectral range
- 470 wavelengths measured simultaneously
- CCD detector
- Take measurements from 20°-90°
- 0.05 seconds data acquisition rate (2-5 seconds is typical)
