Engineering From the Atom Up: Recent Progress in In Situ Scanning Transmission Electron Microscopy and Future Perspectives

Engineering From the Atom Up: Recent Progress in In Situ Scanning Transmission Electron Microscopy and Future Perspectives

Presenter

  • Ondrej Dyck, Center for Nanophase Materials Sciences
March 16, 2018 - 2:00pm to 3:00pm

Abstract 

The pioneering research by Don Eigler in the late eighties and early nineties ignited the nanotechnology wave by showing us how single atoms may be positioned in a scanning tunneling microscope. Until recently, this has remained the only way to controllably move single atoms. However, recent results produced via in situ scanning transmission electron microscopy (STEM) have demonstrated single-atom movement and positioning. This has opened the door to exciting new possibilities in this field. I will provide examples of various beam-induced phenomena that have been documented in STEM to illustrate the wide range of accessible material transitions and then focus particularly on controllable processes. I will also focus on recent advances in computer vision, machine learning, atom detection, beam control, and feedback and how these developments are set to transform the STEM from an observation platform into a fabrication platform.

Sponsoring Organization 

CNMS Institute for Functional Imaging of Materials Seminar Series

Location

  • Center for Nanophase Materials Sciences
  • Building: 8610
  • Room: L-183

Contact Information

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