A simple optical system for real-time size measurements of TRISO fuel pellets... Conference Paper February, 2005
Direct to Digital Holography for High Aspect Ratio Inspection of Semiconductor Wafers... Conference Paper March, 2003
Direct to Digital Holography for Semiconductor Wafer Defect Detection and Review... Conference Paper March, 2002
Large-area change analysis: The CoastWatch Change Analysis Project (C-CAP)... Conference Paper August, 1993