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Atomic Force Microscopy Beyond the Standard Quantum Limit...

by Benjamin J Lawrie, Raphael C Pooser
Publication Type
Conference Paper
Book Title
Symposium on Emerging Quantum Sensing Techniques and Applications I (JF2B)
Publication Date
Conference Name
CLEO: QELS_Fundamental Science 2018
Conference Location
San Jose, California, United States of America
Conference Sponsor
Optical Society of America
Conference Date
-

We explore the impact of quantum noise reduction on force microscopy for broadband off-resonant materials characterization by integrating a multi-spatial-mode squeezed state as the readout field in a commercially available microscope.