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Control of Polar Orientation and Lattice Strain in Epitaxial BaTiO3 Films on Silicon...

by Saul Estandia Rodriguez, Jaume Gazquez Alabart, Matthew F Chisholm, Ignasi Fina, Josep Fontcuberta
Publication Type
Journal
Journal Name
ACS Applied Materials & Interfaces
Publication Date
Page Numbers
25529 to 25535
Volume
10
Issue
30

Conventional strain engineering of epitaxial ferroelectric oxide thin films is based on the selection of substrates with a suitable lattice parameter. Here, we show that the variation of oxygen pressure during pulsed laser deposition is a flexible strain engineering method for epitaxial ferroelectric BaTiO3 films either on perovskite substrates or on Si(001) wafers. This unconventional growth strategy permits continuous tuning of strain up to high levels (ε > 0.8%) in films greater than one hundred nanometers thick, as well as selecting the polar axis orientation to be either parallel or perpendicular to the substrate surface plane.