Abstract
We introduce the use of a higher-order reflection, Si(333), of the silicon analyzer crystals at a backscattering spectrometer to implement analysis of the relaxation dynamics in the samples. This is achieved by monitoring the temperature dependence of the neutron scattering intensity perceived as elastic when measured using Si(111), Si(311), and Si(333) reflections. As a test case, we use a sample with well-characterized, but complex, relaxation pattern, where the non-Lorentzian relaxation function is known to exhibit a set of parameters specific to each temperature point and scattering momentum transfer (Q) value. Even for this very general relaxation pattern, characterized by no constrains on the relaxation function parameters, we successfully map the relaxation times measured using the present approach onto those previously obtained from the full analysis of the quasielastic neutron scattering signal. Analysis of the Q-specific activation energies becomes possible for the Q values accessible simultaneously through Si(111), Si(311), and Si(333) reflections (in the present case, 0.9 Å −1 < Q < 1.9 Å −1). While the dedicated neutron spectrometers for this type of analysis are yet to be constructed, we show that the present-day backscattering spectrometers can be employed, under certain conditions, to analyze temperature dependence of the relaxation time in the samples not amenable to traditional full analysis of the quasielastic neutron scattering signal.
