Abstract
Time of Flight - Secondary Ion Mass Spectrometry (ToF-SIMS) is a Mass Spectrometry (MS) imaging technique that can be used in conjunction with traditional organic geochemical analysis (organics extracted from a crushed sample) in order to determine how molecules observed in the organic extracts were incorporated into a particular rock sample. This type of analysis may be used on samples collected as part of Mars Sample Return (MSR) in order to determine if potential organic compounds were indigenous to Mars or whether they are contaminants.
Here we show that Organic Molecular Biosignatures (OMBs including steranes and derivatives of a carotenoid) are detectable via ToF-SIMS within a Jurassic mudstone. The OMBs are only detectable in areas with high organic carbon, likely kerogen, indicating that they are indigenous to the rock. We conclude that: I) Indigenous OMBs are detectable via ToF-SIMS in ancient, kerogen-rich samples; II) the presence of a molecular ion strengthens the interpretation of ToF-SIMS spectra of complex natural material, and III) the spatial co-occurrence of kerogen and potentially indigenous OMBs in ancient sediments is a valid test of their character. These conclusions are directly relevant to MSR sample selection as well as the analysis of MSR samples upon return.