Abstract
Noisy intermediate-scale quantum (NISQ) devices offer unique platforms to test and evaluate the behavior of quantum computing. However, validating circuits on NISQ devices is difficult due to fluctuations in the underlying noise sources and other nonreproducible behaviors that generate computational errors. Here we present a test-driven approach that decomposes a noisy, application-specific circuit into a series of bootstrapped experiments on a NISQ device. By characterizing individual subcircuits, we generate a composite noise model for the original quantum circuit. We demonstrate this approach to model applications of Greenberger-Horne-Zeilinger(GHZ)-state preparation and the Bernstein-Vazirani algorithm on a family of superconducting transmon devices. We measure the model accuracy using the total variation distance between predicted and experimental results, and we demonstrate that the composite model works well across multiple circuit instances. Our approach is shown to be computationally efficient and offers a trade-off in model complexity that can be tailored to the desired predictive accuracy.
