Abstract
Tungsten is the primary candidate for plasma-facing materials in the critical regions of a magnetic fusion energy (MFE) device, such as a tokamak. However, tungsten (and many other metals) grow copious nanotendril "fuzz" when exposed to fusion-relevant He-bearing plasmas, and the impact of this fuzz on reactor operation is still unknown. Further, the mechanism of fuzz growth is also poorly understood at present. In order to experimentally probe the growth mechanisms, we developed a new sample preparation technique to examine the interface of individual nanotendril roots with the substrate (substrate/tendril interface) using electron microscopy and measured the grain boundary character distributions (GBCDs) of substrate/tendril interfaces, the GBs within individual tendrils (tendril/tendril interfaces), and GBs within the substrate (substrate/substrate interfaces). We find the substrate/tendril and tendril/tendril GBCDs are essentially indistinguishable, but very different from the substrate/substrate GBCDs, which implies that tendril growth periodically forms new GBs at the substrate/tendril interface, and these GBs are pushed upward to become tendril/tendril interfaces within the fuzz mat. These results will help guide future computational modelling studies to elucidate the details of the growth mechanisms.
