Abstract
The spectral tunability of semiconductor-metal multilayer structures can provide a channel for the conversion of light into useful mechanical actuation. Response of suspended silicon, silicon nitride, chromium, gold, and aluminum microstructures is shown to be utilized as a detector for visible and infrared spectroscopy. Both dispersive and interferometric approaches are investigated to delineate the potential use of the structures in spatially resolved spectroscopy and spectrally resolved microscopy. The thermoplasmonic, spectral absorption, interference effects, and the associated energy deposition that contributes to the mechanical response are discussed to describe the optomechanical detection to be of potential importance in future integrated spectrometers.
