Publication Type
Conference Paper
Book Title
Microscopy and Microanalysis
Publication Date
Volume
14 Sup2
Publisher Location
New York, New Jersey, United States of America
Conference Name
Microscopy and Microanalysis 2008
Conference Location
Albuquerque, New Mexico, United States of America
Conference Sponsor
Microscopy Society of America
Conference Date
-
Abstract
Silicon drift detectors (SDDs) are rapidly becoming the energy dispersive spectrometer of choice especially for scanning electron microscopy applications. The complementary features of large active areas (i.e., collection angle) and high count rate capability of these detector contribute to their popularity, as well as the absence of liquid nitrogen cooling of the detector. The performance of an EDAX Apollo 40 SDD on a JEOL 6500F SEM will be discussed.