Publication Type
Journal
Journal Name
Ultramicroscopy
Publication Date
Page Numbers
1 to 7
Volume
181
Abstract
Abstract Octahedral tilt behavior is increasingly recognized as an important contributing
factor to the physical behavior of perovskite oxide materials and especially their interfaces,
necessitating the development of high-resolution methods of tilt mapping. There are
currently two major approaches for quantitative imaging of tilts in scanning transmission
electron microscopy (STEM), bright field (BF) and annular bright field (ABF). In this paper, we
show that BF STEM can be reliably used for measurements of oxygen octahedral tilts. ...
