Publication Type
Conference Paper
Publication Date
Conference Name
ICAM 2008
Conference Location
Kottayam, India
Conference Sponsor
Mahatma Gandhi University, School of Chemical Sciences
Conference Date
-
Abstract
The motivation for aberration correction in electron microscopy was primarily to improve lateral resolution, and its successful achievement enabled the direct imaging of sub-�ngstrom lattice spacings in a crystal. However, the smaller probe results in greatly enhanced sensitivity for imaging individual atoms, and in addition, the wider useable aperture results in a smaller depth of field.
