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Study of Classifiers for U-235 Source Signatures Using Gamma Spectral Measurements...

by Nageswara S Rao, David A Hooper, Jennifer L Ladd-lively
Publication Type
Conference Paper
Book Title
Proceedings of the 63rd INMM Annual Meeting
Publication Date
Page Numbers
1 to 10
Publisher Location
Arlington, Virginia, United States of America
Conference Name
63rd INMM Annual Meeting
Conference Location
Alexandria, Virginia, United States of America
Conference Sponsor
Institute of Nuclear Materials Management
Conference Date
-

Signatures associated with low-level U-235 sources are studied from a classification analytics perspective, using NaI gamma-ray spectral measurements from detectors located at various distances from the source. Data sets collected at a shielded facility are utilized, wherein the source is introduced via a conduit into a formation of 21 NaI detectors deployed over 6 x 6 meters area in a formation of two concentric circles and one spiral. The activity levels in the spectral regions associated with potential U-235 signatures are estimated as counts at 1 second intervals, and are used as features to train classifiers for detecting the presence of the source. Eight different classifiers are trained and tested using the background and source measurements collected over multiple experimental runs. As expected, the classifier performance improved overall as measurements from the detectors closer to source are used, but also revealed unexpectedly low performance by two detectors that are identically produced and configured as others. Six of eight classifiers have an overall comparable performance, for example, three of them achieved zero training error and 99% detection at 4% false alarm rate for a detector located 1.3 meters away from the source. Also, larger training sets led to improved classification performance across all classifiers, and interestingly, the classifiers with the minimum training error did not necessarily achieve the highest classification performance on test data.