Glove box AFM

Atomic Force Microscopy in Controlled Glove Box Environment

For some materials, AFM measurements in controlled environments are required or preferable. This is particularly important if a material strongly reacts or deteriorates in air or if the measurements are impacted by the presence of water and oxygen. CNMS provides an Ar filled glove box equipped with a Bruker Dimension Icon AFM. The large sample stage can be moved linearly in x- and y- directions, which makes it suitable for larger samples. A range of AFM modes for functional material characterization are available.

Features:

Available modes:

• Contact
• Tapping
• Fast Force Volume
• Peak Force Tapping
• Peak Force Quantitative Nanomechanics
• Conductive AFM
• Electric Force Microscopy
• Kelvin Probe Microscopy
• Piezoresponse Force Microscopy
• Custom Band Excitation PFM modes through 

Specifications:

• Sample size 12x12 mm
• Scan range (80x80 um) 
• Z height limit (<10 µm)
• Environmental Control 
• Glove box (Ar filled) 
• Temperature stage (sample heating 0-250 C) 

Applications:

2-dimensional materials

Thin films

Ferroelectrics

Semiconductors

Polymers

Equipment: 

Bruker Dimension Icon AFM