Magnetic force microscopy is a non-contact technique that measures the magnetostatic interactions between a magnetic coated AFM tip and a sample, based on the detection of the long range stray magnetic fields emerging from the surface. It can be performed in a classical two pass mode or in a multifrequency configuration to isolate long range magnetostatic interactions from electrostatic and short range van der Waals forces. Variable field MFM measurements can be performed by applying and adjustable magnetic field either in plane or out of plane while simultaneously making MFM measurements.
Specifications
- Sample size up to 12x12 mm2
- Scan range (30x30 um, 80x80 um)
- Temperature stage (sample heating 0-250 C)
- Variable temperature MFM in UHV
- In plane magnetic field up to 1T in environmental conditions
Equipment
Cypher AFM, MFP 3D AFM (Asylum Research) in ambient
Icon Dimension (Bruker) in ambient
Icon Dimension (Bruker) in Ar glovebox
Drive AFM (Nanosurf) in ambient
Omicron AFM
Contact
Senior R&D Staff Scientist