Aberration Corrected STEM
Aberration-corrected scanning transmission electron microscope with an ‘extreme Schottky’ high-brightness field emission gun (X-FEG) and variable operating voltages (60 and 300 kV). Equipped with Gatan Quantum GIF for dual-EELS and fast spectrum imaging , One View Camera and STEMx for 4D-STEM experiments, and specialty holders (Cryo, Tomography, Liquid, Gas, Thermal, Electrical Bias)
Aberration-corrected S/TEM-EELS microscope equipped with a cold-field emission gun, JEOL ASCOR aberration corrector, operating at 30kV, 60kV, 80kV, and 200kV with Gatan Quantum GIF for EELS/EFTEM, dual large solid angle EDS, secondary electron, segmented and pixelated STEM detectors. Specialty holders available for Cryo STEM, tomography, heating and electrical bias experiments.
Ultra high-vacuum, low voltage (60-100kV), aberration-corrected STEM/EELS equipped with a cold-field emission gun, Nion IRIS spectrometer, and Dectris ELA hybrid-pixel detector. Specialty holders available for heating and electrical biasing experiments.
Cryo Electron Microscopy
Thermo Fisher Scientific Krios G4 Cryo-TEM
Dedicated 300kV Cryo-S/TEM, equipped with a high brightness "extreme Schottky" field emission gun (X-FEG), is ideally suited for cryo-electron tomography, single particle analysis, and micro-electron diffraction applications.
Thermo Fisher Scientific Talos L120C TEM
Dedicated 120kV Cryo-TEM, equipped with a LaB6 source, Ceta CMOS Camera, and Gatan multi-specimen, single tilt cryo-transfer holder for cryo-TEM imaging and analysis.
Thermo Fisher Scientific Helios Hydra 5 Cryo PFIB
DualBeam cryogenic plasma FIB instrument equipped with four plasma bean ion sources (Xe, Ar, O, and N), cryogenic system for sample preparation and transfer, and SE/BSE/ICE/EDS/EBSD detectors.
Atom Probe Tomography
A local electrode atom probe (LEAP) with a UV, 250 kHz laser, a 200 kHz high-voltage pulse generator, reflectron energy compensating lens, and a single atom cross delay line position-sensitive detector.
Thermo Fisher Helios 5 CX DualBeam FIB
Dedicated dual beam focused ion beam instrument used for APT preparation of site-specific, needle shaped specimens and equipped with SE, TLD, DBS and EDS detectors.
Focused ion beam instrument dedicated to the fabrication of site-specific, needle shaped specimens required for APT.
TEM Specimen Preparation
Fischione Instruments Model 1040 NanoMill
This instrument is an ultra-low energy argon ion beam milling system for thinning TEM samples.
Fischione Instruments Model 1010 Ion Mill
This instrument uses an argon ion beam to perform final ion-beam milling of the specimen to electron transparency.
Gatan Ilion Model 693 Precision Cross-Section Mills
The Gatan Model 693 Ilion Precision Cross-Section Milling System is a broad beam argon ion milling system for the preparation of ultra-smooth surfaces for SEM and EBSD.
This instrument uses an argon ion beam to perform final ion-beam milling of the specimen to electron transparency.
Thermo Fisher Vitrobot Mark IV
This semi-automated vitrification system allows for fast, easy, and reproducible cryoEM sample preparation.
Leica EM ICE High Pressure Freezer
Allows for cryo-immobilization of solvated samples under high pressure, with controlled freezing to prevent crystalline ice formation.
Leica EM UC7 Cryogenic Ultramicrotome
Allows for ultra-thin sectioning of resin-embedded, room temperature samples or cryo-immobilized samples.