The Scanning Oscillator is a multifrequency tool that has been developed using Matlab and external hardware to be implemented on all types of excitation signals in Atomic Force Microscopy, to perform advanced spectroscopies. It enables to apply a multifrequency signal for simultaneous excitation of one or divers stimuli to the sample and study the multiscale dynamical properties.
Features:
The data is captured in G-mode (general mode), without any hardware lock-in. Instead, the lock-in is performed at the host computer on-demand and has several benefits including but not limited to the possibility of applying filters, tuning phase offsets, and exclusively looking at the frequencies of interest. The full data set obtained in this way is three dimensional, with two dimensions for the scan directions X and Y and the third dimension for the voltage space. It is important to note that the Scanning Oscillator Microscopy experiments are performed on a pixel-by-pixel basis, where the tip dwells on a pixel, applies the drive waveform, acquires its response, and streams it to the computer all simultaneously. This is repeated for all the pixels in the image in a line-by-line fashion giving the appearance of a raster scan experiment and providing with an excellent signal synchronization between the pixels and tip displacement, which enables us to visualize the dataset in two important formats, spatial maps and temporal maps.
Specifications:
- Frequency bandwidth: Hz to 5 MHz
- Compatible with all SPM platforms
Applications:
Ferroelectric domain wall dynamics
Multiscale dynamics of ionic conductors
Contacts
R&D Associate
Senior R&D Staff
Distinguished R&D Staff