Low Temperature Resistance Anomaly at SrTiO3 Grain Boundaries - Evidence for Interface Induced Phase Transition... Journal November, 2005
Three Dimensional Imaging of Individual Hafnium Atoms at a Si/SiO2/HfO2 Dielectric Interface Journal August, 2005
Materials Characterization in the Aberration-Corrected Scanning Transmission Electron Microscope Journal August, 2005
Radial Distribution Function Analyses of Amorphous Carbon Films Containing Silicon and Hydrogen by Energy-Filtered Diffraction and EXELFS Journal August, 2005
Three-Dimensional Imaging of Individual Hafnium Atoms Inside a Semiconductor Device... Journal July, 2005
Limitations to the Measurement of Oxygen Concentrations by HRTEM Imposed by Surface Roughness Journal April, 2005
Nanostructure Enhanced Ionic Transport in Fullerene Based Nanocomposite Electrolytes... Journal February, 2005
