March 13, 2015 – Oak Ridge National Laboratory scientists developed a novel technique for microscopy and used it to unveil the full depth of materials properties on the nanoscale. They report their findings (http://www.nature.com/ncomms/2015/150313/ncomms7550/full/ncomms7550.html) in this month’s Nature Communications. By improving the imaging transfer to the computational models, G-mode microscopy at the Center for Nanophase Materials Sciences isolates characteristics of material interfaces without sacrificing relevant data. This design provides a foundation for “smart” filters – an adaptive, rapid “Google” for data. “Oak Ridge is one of the best places – if not the best place – in the world for Big Data processing,” said ORNL’s Alexei Belianinov. “Here, we provide a method that can take advantage of high-performance computational experts and facilities and solve realistic problems.” – written by Ashanti Washington
