Publication

Atomic-resolution electric field measurements with a universal detector...

by Jordan A Hachtel, Arashdeep Thind, Rohan Mishra, Juan C Idrobo Tapia, Miaofang Chi

Publication Type

Conference Paper

Journal Name

Microscopy and Microanalysis

Publication Date

August, 2018

Page Numbers

114 to 115

Volume

Issue

Conference Name

Microscopy & Microanalysis 2018

Conference Location

Baltimore, Maryland, United States of America

Conference Sponsor

Microscopy Society of America

Conference Date

Aug 5, 2018 - Aug 9, 2018

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Researchers