Skip to main content
SHARE
Publication

Automated Controller Hardware-In-The-Loop Testbed for EV Charger Resilience Analysis

by Michael R Starke, Namwon Kim, Benjamin R Dean, Steven L Campbell, Madhu Sudhan Chinthavali
Publication Type
Conference Paper
Book Title
2023 IEEE Transportation Electrification Conference & Expo (ITEC)
Publication Date
Page Numbers
1 to 6
Publisher Location
Detroit, Michigan, United States of America
Conference Name
2023 IEEE Transportation Electrification Conference & Expo (ITEC)
Conference Location
Detroit, Michigan, United States of America
Conference Sponsor
IEEE
Conference Date
-

This paper focuses on the development of a tool that includes an automated testbed with controls, protection, and communications integrated into a real-time system to provide a platform to generate data sets for failure modes and effects analysis. This tool establishes a value for automation of data generation for different scenarios and addresses the gap of nonexistent field data for different applications and use cases. The features of this tool can further be expanded to include multiple power electronics models, communication protocols, and scaled system architectures. This general framework was evaluated for a DC fast charger system use case to provide quantitative solution for resiliency.