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Automatic detection of crystallographic defects in STEM images by unsupervised learning with translational invariance...

Publication Type
Conference Paper
Journal Name
Microscopy and Microanalysis
Publication Date
Page Numbers
1460 to 1462
Volume
27
Issue
S1
Conference Name
Microscopy and Microanalysis
Conference Location
Pittsburgh, Pennsylvania, United States of America
Conference Sponsor
Microscopy Society of America
Conference Date
-
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