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Beam-induced Changes of FePt Nanoparticles during STEM In-situ Annealing...

by J. Wittig, James Bentley, Lawrence F Allard Jr, M.s. Wellons, C.m. Lukehart
Publication Type
Conference Paper
Book Title
Proceedings Microscopy and Microanalysis 2008
Publication Date
Page Numbers
348 to 349
Volume
14(Su2)
Publisher Location
Cambridge, United Kingdom
Conference Name
Microscopy and Microanalysis 2008
Conference Location
Albuquerque, New Mexico, United States of America
Conference Sponsor
Microscopy Soc Amer, Microbeam Analysis Soc, Intern Metallographic Soc, Intern Soc Analytic Cytology
Conference Date
-