Abstract
Ion channeling is a powerful quantitative technique for studying ion-irradiation induced defect evolution in single crystalline materials. An iterative procedure to determine dechanneling yields has been developed for decades, serving as a major method for analyzing experimental channeling data. The applicability of such procedure is, however, generally limited to the crystalline damage with only point defects and local amorphous domains. For the other cases, such as irradiated metals, the assumption of direct-backscattering free has usually been made. In the present study, Ni, TiAl, MgO, and SrTiO3 single crystals are selected as four model materials, representing metals, intermetallic alloys, and ceramic compounds with different defect evolution processes under irradiation, to investigate the fidelity of applying dechanneling analysis on various types of defects. The pure dechanneling assumption is shown oversimplified in Ni irradiated with low fluence self-ions and may result in error on the derived damage profile. Moreover, the iterative procedure of dechanneling analysis is shown valid for more general situations than the randomly distributed atoms, including those not exhibiting a peak in channeling spectra. The disappearance of damage peak in channeling spectra is attributed to the combined effects of small (but non-zero) scattering factor, long-range damage effects, and non-ignorable damage level in pristine crystals. Furthermore, the ratio of direct backscattering to dechanneling areas provides information on defect configurations in the materials containing a well-defined damage peak in channeling spectra. The contribution from dechanneling sources increases from SrTiO3, TiAl, to MgO, according to the derived scattering and dechanneling factors.