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Characterization of durable nanostructured thin film catalysts tested under transient conditions using analytical aberration-...

Publication Type
Conference Paper
Publication Date
Conference Name
220th ECS Meeting and Electrochemical Energy Summit
Conference Location
Boston, Massachusetts, United States of America
Conference Date
-

The stability of Ru0.1Ir0.9 oxidation evolution reaction (OER) catalysts deposited on Pt-coated nanostructured thin films (NSTFs) has been investigated by aberration-corrected electron microscopy. Accelerated stress tests showed that the OER catalysts significantly improved the durability of the Pt under cell reversal conditions. High-resolution images of the end-of-life NSTFs showed significant Ir loss from the whisker surfaces, while no Pt loss was observed, indicating that the OER catalysts had protected the catalyst coated whisker surfaces from degradation.