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Characterizing the Stability of NISQ Devices...

by Samudra Dasgupta, Travis S Humble
Publication Type
Conference Paper
Journal Name
IEEE International Conference on Quantum Computing and Engineering
Book Title
2020 IEEE International Conference on Quantum Computing and Engineering (QCE)
Publication Date
Page Numbers
419 to 429
Issue
1
Conference Name
2020 IEEE International Conference on Quantum Computing and Engineering (QCE)
Conference Location
None, Nebraska, United States of America
Conference Sponsor
IEEE
Conference Date
-

In this study, we focus on the question of stability of NISQ devices. The parameters that define the device stability profile are motivated by the work of DiVincenzo in [9] where the requirements for physical implementation of quantum computing are discussed. We develop the metrics and theoretical framework to quantify the DiVincenzo requirements and study the stability of those key metrics. The basis of our assessment is histogram similarity (in time and space). For identical experiments, devices which produce reproducible histograms in time, and similar histograms in space, are considered more reliable. To investigate such reliability concerns robustly, we propose a moment-based distance (MBD) metric. We illustrate our methodology using data collected from IBM's Yorktown device. Two types of assessments are discussed: spatial stability and temporal stability.