Publication Type
Journal
Journal Name
Ultramicroscopy
Publication Date
Page Numbers
172 to 173
Volume
109
Abstract
A phenomenological method is developed to determine the composition of materials, with atomic
column resolution, by analysis of integrated intensities of aberration-corrected Z-contrast scanning
transmission electron microscopy images. The method is exemplified for InAsxP1!x alloys using epitaxial
thin films with calibrated compositions as standards. Using this approach we have determined the
composition of the two-dimensional wetting layer formed between self-assembled InAs quantum wires
on InP(0 01) substrates.