SHARE

Publication

Composition of 4H-SiC/SiO₂ Interfaces by Electron Energy-Loss Spectroscopy...

by James Bentley, K.-c. Chang, Y. Cao, L.m. Porter

Publication Type

Conference Paper

Journal Name

Microscopy and Microanalysis

Publication Date

July, 2006

Page Numbers

1142 to 1143

Volume

12

Issue

suppl 2

Conference Name

Microscopy and Microanalysis

Conference Location

Chicago, Illinois, United States of America

Conference Sponsor

MSA, MAS, IMS, MSC/SMC

Conference Date

Jul 30, 2006 - Aug 3, 2006