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Publication

Design and Performance Characteristics of the ORNL Advanced Microscopy Laboratory and JEOL 2200FS-AC Aberration-Corrected STE...

by Lawrence F Allard Jr, Douglas Blom, Michael O'keefe, Satoshi Mishina

Publication Type

Conference Paper

Book Title

Proceedings Microscopy and Microanalysis 2005

Publication Date

July, 2005

Volume

11

Conference Name

Microscopy and Microanalysis 2005

Conference Location

Honolulu, Hawaii, United States of America

Conference Sponsor

Microscopy Society of America

Conference Date

Jul 31, 2005 - Aug 4, 2005