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Discovering the Electron Beam Induced Transition Rates for Silicon Dopants in Graphene with Deep Neural Networks in the STEM...

Publication Type
Conference Paper
Journal Name
Microscopy and Microanalysis
Publication Date
Page Numbers
1932 to 1933
Volume
29
Issue
Supplement
Conference Name
Microscopy and Microanalysis 2023
Conference Location
Minneapolis, Minnesota, United States of America
Conference Sponsor
JEOL, Gatan, Ted Pella, Oxford Instruments, Mel-build, Zeiss
Conference Date
-
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