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Domain Wall Motion Across Various Grain Boundaries in Ferroelectric Thin Films...

Publication Type
Journal
Journal Name
Journal of the American Ceramic Society
Publication Date
Page Numbers
1848 to 1857
Volume
98
Issue
6

Domain wall movement at and near engineered 10º, 15º, and 24º tilt and 10º and 30º twist grain boundaries was measured by band excitation piezoresponse force microscopy for Pb(Zr,Ti)O3 films with Zr/Ti ratio of 45/55 and 52/48. A minimum in nonlinear response was observed at the grain boundary for the highest angle twist and tilt grain boundaries, while a maximum in nonlinear response was observed at the 10º tilt grain boundaries. The observed nonlinear response was correlated to the domain structure imaged in cross section by transmission electron microscopy.