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EELS Valence Mapping in Electron Beam Sensitive FeFx/C Nanocomposites...

by F. Cosandey, J.f. Al-sharab, Glenn Amatucci, James Bentley
Publication Type
Conference Paper
Journal Name
Microscopy and Microanalysis
Publication Date
Page Numbers
1262 to 1263
Volume
13
Issue
suppl 2
Conference Name
Microscopy and Microanalysis 2007
Conference Location
Fort Lauderdale, Florida, United States of America
Conference Sponsor
Microscopy Society of America, Microbeam Analysis Society, International Metallographic Society
Conference Date
-