Publication Type
Journal
Journal Name
Journal of Nuclear Materials
Publication Date
Page Number
152371
Volume
540
Issue
1
Abstract
We investigate the effect of the electronic stopping power on defect production due to ion irradiation of cubic silicon carbide using molecular dynamics simulations. We simulate 20 keV and 30 keV Si and C ions, with and without the electronic energy loss. The results show that the electronic stopping effects are more profound in the case of C irradiation, where the ratio of the electronic energy loss Se to the nuclear energy loss Sn is much larger compared to the ratio for Si ions. These findings indicate that this ratio plays a role in the effect of the electronic stopping on ion irradiation.
