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Emittance studies of the SNS external-antenna H- ion source...

Publication Type
Conference Paper
Journal Name
Review of Scientific Instruments
Publication Date
Volume
81
Issue
2
Conference Name
the 13th International Conference on Ion Sources
Conference Location
Gatlinburg, Tennessee, United States of America
Conference Date

A new Allison-type emittance scanner has been built to characterize the ion sources and low energy beam transport systems at SNS. In this work, the emittance characteristics of the H- beam produced with the external-antenna RF-driven ion source and transported through the 2-lens electrostatic LEBT are studied. The beam emittance dependence on beam intensity, extraction parameters, and the evolution of the emittance and twiss parameters over beam pulse duration are presented.