Publication Type
Journal
Journal Name
European Physics Letters
Publication Date
Page Number
17010
Volume
96
Issue
1
Abstract
The surface and grain boundary resistivities of polycrystalline Au films are determined without any adjustable parameters by comparing the changes in residual resistivity and average grain size before and after annealing. The measured resistivity data point to a linear dependence of the surface roughness on the average grain size which suggests a self-similar scaling behavior.