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Grating Polarizers at 170 GHz for ECRH Systems: Low Power Tests and Simulations...

by Hannah Hoffmann, Sudheer Jawla, Michael Shapiro, Gregory R Hanson, Richard Temkin
Publication Type
Journal
Journal Name
IEEE Transactions on Antennas and Propagation
Publication Date
Page Numbers
4719 to 4728
Volume
66
Issue
9

The elliptical polarization produced by a pair of sinusoidally profiled miter-bend grating polarizers has been measured experimentally and found to be in excellent agreement with theory. The polarizers were designed to be used at 170 GHz in the miter bends of a 63.5 mm corrugated metallic waveguide for creating the arbitrary elliptically polarized microwave beam needed for electron cyclotron resonance heating of plasma. Using a vector network analyzer to generate a linearly polarized HE 11 incident mode, each polarizer was individually tested to measure the rotation α and ellipticity β of the elliptically polarized reflected microwave beam as a function of the grating rotation angle. The grating polarizers were then tested together to measure the elliptical polarization as a function of the angles of the combination of the two polarizers arranged sequentially on the transmission line. The map of the ellipticity versus grating angles agreed very well with numerical simulations using high-frequency structure simulator. Numerical simulations show that up to eight combinations of rotation angles of the two grating polarizers can provide the same ellipticity but with the varying ohmic loss, thus allowing the choice of settings to minimize the ohmic loss, a necessary consideration to minimize heating effects in megawatt power level systems.