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Hall Effect and Raman Analysis of Residual Damage and Free Electron Concentration in Si-Implanted GaAs: A Quest for Better D...

by I. Desnica-frankovic, U. Desnica, K. Furic, J. Wagner, Tony E Haynes
Publication Type
Journal
Journal Name
Journal of Physics and Chemistry of Solids
Publication Date
Page Numbers
1158 to 1163
Volume
66
Issue
7