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Publication

High Resolution Imaging with an Aberration Corrected JEOL 2200FS-AC STEM/TEM...

by Douglas Blom, Lawrence F Allard Jr, Michael O'keefe, Satoshi Mishina
Publication Type
Conference Paper
Book Title
Proceedings Microscopy and Microanalysis 2005
Publication Date
Volume
11
Conference Name
Microscopy and Microanalysis
Conference Location
Honolulu, Hawaii, United States of America
Conference Sponsor
Microscopy Society of America
Conference Date
-