Skip to main content
SHARE
Publication

The Lifetime Estimate for ACSR Single-Stage Splice Connector Operating at Higher Temperatures...

by Jy-an Wang, Joe Graziano, John Chan
Publication Type
Journal
Journal Name
IEEE Transactions on Power Delivery
Publication Date
Page Numbers
1317 to 1325
Volume
26
Issue
3

This paper is the continuation of Part I effort to develop a protocol of integrating analytical and experimental approaches to evaluate the integrity of a full tension single-stage splice connector (SSC) assembly during service at high operating temperature.1The Part II efforts are mainly focused on the thermal mechanical testing, thermal-cycling simulation and its impact on the effective lifetime of the SSC system. The investigation indicates that thermal cycling temperature and frequency, conductor cable tension loading, and the compressive residual stress field within a SSC system have significant impact on the SSC integrity and the associated effective lifetime.