Publication Type
Journal
Journal Name
Journal of Applied Physics
Publication Date
Page Number
223704
Volume
116
Issue
22
Abstract
Measurement of the magnetoresistance (MR) of Au films as a function of temperature and film thickness reveals a strong dependence on grain size distribution and clear violation of the Kohler’s rule. Using a model of random resistor network, we show that this result can be explained if the MR arises entirely from inhomogeneity due to grain boundary scattering and thermal activation of grain boundary atoms.