Publication Type
Journal
Journal Name
Applied Physics Letters
Publication Date
Page Number
212901
Volume
98
Issue
21
Abstract
Band excitation piezoresponse force microscopy enables local investigation of the nonlinear
piezoelectric behavior of ferroelectric thin films. However, the presence of additional
nonlinearity associated with the dynamic resonant response of the tip-surface junction can
complicate the study of a material’s nonlinearity. Here, the relative importance of the two
non-linearity sources was examined as a function of the excitation function. It was found that
in order to minimize the effects of nonlinear tip-surface interactions but achieve good signal
to noise level, an optimal excitation function must be used.
