Publication

Measuring Single Atomic Defects in 2D Materials with Off-axis EELS Using Real-time AI-driven Detection

by Kevin M Roccapriore, Maxim A Ziatdinov, Riccardo Torsi, Joshua Robinson, Sergei Kalinin

Publication Type

Conference Paper

Journal Name

Microscopy and Microanalysis

Publication Date

August, 2023

Page Numbers

392 to 393

Volume

Issue

Supplement

Conference Name

Microscopy and Microanalysis 2023

Conference Location

Minneapolis, Minnesota, United States of America

Conference Sponsor

JEOL, Gatan, Ted Pella, Zeiss, Oxford Instruments, Mel-build

Conference Date

Jul 23, 2023 - Jul 27, 2023

View DOI Listing

Researchers