Abstract
A pinhole neutron diffraction (PIND) technique was developed to enable improving the spatial resolution down to 250 μm. Instead of the conventional engineering diffraction method which integrates all the diffraction signals on the detector plane, the PIND setup utilizes the diffraction pattern of each pixel on 2D detectors. The proposed PIND arrangement enables improving the spatial resolution of time-of-flight instruments and allows solving problems involving steep gradients of strain or texture. The phase content and preferential orientation of grains inside samples can be spatially resolved in 2D/3D. Further, PIND retains the capability of in-situ non-destructive neutron diffraction mapping of lattice strain and grain orientation under external stimuli such as temperature and force.
