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Probing electrical transport in individual carbon nanotubes and junctions...

by An-ping Li, Tae Hwan Kim, John F Wendelken, Wenzhi Li, Gaohui Du
Publication Type
Journal
Journal Name
Nanotechnology
Publication Date
Page Number
485201
Volume
19
Issue
48

The electrical transport properties of individual carbon nanotubes (CNTs) and multi-terminal junctions of CNTs are investigated with a quadraprobe scanning tunneling microscope. The CNTs are made of herringbone-type stacking graphite sheets with 20�a-angle to the tube axis, and the CNT junctions are free from catalytic particles in the junction areas. The CNTs have a significantly higher resistivity than conventional CNTs with concentric walls. The straight CNTs display linear current-voltage (I-V) characteristics, indicating diffusive transport rather than ballistic transport. The structural deformation in CNTs with bends substantially increases the resistivity in comparison with the straight segments on the same CNTs, and the I-V curve departs slightly from linearity in curved segments. The junction area of the CNT junctions behaves like an ohmic-type scattering center with linear I-V characteristics. In addition, gating effect has not been observed, in contrast to that of conventional multi-walled CNT junctions. These unusual transport properties can be attributed to the enhanced inter-layer interaction in the herringbone-type CNTs.