Abstract
A scanning probe microscopy (SPM) based technique for probing local ionic dynamics in electrochemically-active materials based on the first-order reversal curve current-voltage (FORC-IV) method is presented. FORC-IV imaging mode is applied to a Ca-substituted bismuth ferrite (Ca-BFO) system to separate the electronic and ionic phenomena in this material and visualize the spatial variability of these behaviors. The variable-temperature measurements further demonstrate the interplay between the thermally and electric-field-driven resistance changes in Ca-BFO. The FORC-IV is shown to be a simple, powerful and flexible method for studying electrochemical activity of materials at the nanoscale and, in conjunction with the Electrochemical Strain Microscopy, for differentiating ferroelectric and ionic behaviors.
