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Probing Structural and Chemical Short-Range Ordering in Fe5-xGeTe2 using 4D-STEM and EELS

by Haoyang Ni, Miaofang Chi, Andrew F May, Jian-min Zuo
Publication Type
Conference Paper
Journal Name
Microscopy and Microanalysis
Publication Date
Page Numbers
1522 to 1524
Volume
30
Issue
Supplement
Conference Name
Microscopy and Microanalysis 2024
Conference Location
Cleveland, Ohio, United States of America
Conference Sponsor
JEOL, Oxford Instruments, Melbuild, Diatome U.S., Ametek, Ted Pella. inc., Zeiss, Thermo Fisher Scientific, Dectris, Protochip, Tescan, Raith, Biophotonics
Conference Date
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