Skip to main content
SHARE
Publication

Protection and temperature-dependent switching characterization of latest generation 10 kV SiC MOSFETs...

by Leon M Tolbert, Fei Wang, Sheng Zheng, Zheyu Zhang, Shiqi Ji
Publication Type
Conference Paper
Book Title
Proceedings of the IEEE Applied Power Electronics Conference and Exposition
Publication Date
Page Numbers
783 to 788
Conference Name
IEEE Applied Power Electronics Conference and Exposition
Conference Location
Tampa, Florida, United States of America
Conference Sponsor
IEEE
Conference Date
-